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MIEL - Characterization of materials and systems
MIEL - Characterization of materials and systems
MIEL - Characterization of materials and systems

> Teams > Team MIEL > In situ operando characterizations (Team MIEL)

Raman spectroscopy and imaging

Raman spectroscopy is a non-destructive characterization tool of the composition and structure of a solid or liquid material.
This technique allows to analyse very small amount of materials, surfaces and/or thin layers (Raman imaging) and to explore the volume of transparent materials maintaining a spatial resolution of the order of microns (confocal Raman spectrometry).
 
Raman imaging provides informations on the structural and chemical heterogeneity of the observed area with a spatial resolution that can be submicron. These include, for example, mapping of constrains in materials for microeletronic by UV Raman imaging at 363 nm. The microphotoluminescence allows to obtain mapping with good spectral resolution coupled to Raman imaging (location of dislocations in the GaN structure, structures of polycristaliine alumina).
 
LEPMI has several spectrometers covering the spectral range from near IR (785 nm) to UV (325 nm)
- T64000 Jobin-Yvon visible (514, 488 and 647 nm) and UV (363 and 325 nm) (CMTC management)
- InVia RM 1000 Renishaw (514 nm)
- InVia Renishaw (514 and 785 nm)
 

Date of update January 27, 2016

Université Grenoble Alpes